Reduce test data complexity
706afb254e12
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Description

Reduce test data complexity

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Provenance

kislinsk	Authored on Nov 19 2020, 11:35 AM
kislinsk	Pushed on Nov 19 2020, 11:35 AM

Parents

rMD84729632176a: Add VTK 9 compatible reference screenshot

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Event Timeline

kislinsk committed rMD706afb254e12: Reduce test data complexity (authored by kislinsk).Nov 19 2020, 11:35 AM

Changes (6)

Path

Size

AICPRegistration/

	AICPRegistration/
	InteractionTestData/

	targets_head_green.mps/
	ReferenceData/


	TestMoveRemovePoints.mps

	targets_head_red.mps/
	ReferenceData/


	TestMoveRemovePoints.mps

rMD706afb254e12

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AICPRegistration/head_green.stl

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AICPRegistration/head_green.vtp

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AICPRegistration/head_red.stl

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AICPRegistration/head_red.vtp

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AICPRegistration/targets_head_green.mps

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AICPRegistration/targets_head_red.mps

Reduce test data complexity706afb254e12Actions

Description

Details

Event Timeline

Changes (6)

rMD706afb254e12

AICPRegistration/head_green.stl

AICPRegistration/head_green.vtp

AICPRegistration/head_red.stl

AICPRegistration/head_red.vtp

AICPRegistration/targets_head_green.mps

AICPRegistration/targets_head_red.mps

Reduce test data complexity
706afb254e12
Actions