Status:
One can use line planar figure and compute statistics.
The statistics view will then also over the option to see an intensity profile

Requested feature:
It would be great if one can decide to calculate the mean profile of multple slices or parallel lines.

Option 1: Assume the line has "a width" and parallel lines are also evaluated (just transposed to the original line). One can chose the number of lines / the width of the capture region. The profile is then the mean

Option 2: You also go n "slices" up and "down" (so porjecting the line on other slices and get the values there to compute a mean profile.

Reason: E.g. in probe measurments for nuc med, thin feature would be helpfull to streamline the evaluation. This is needed to surpress noise and would get rid of the need to manually drawing parallel lines and calcualting the mean profile by hand. (Currently that is the only reason why MITK is not used as defualt in that group.

Got the request from Jörg Peter (E020).